- Temperature Instruments[6]
- Hardness Testers[6]
- Gauges[6]
- Other Measuring & Analysing Instruments[6]
- Other Measuring & Gauging Tools[6]
- Testing Equipment[6]
- Other Physical Measuring Instruments[4]
- Industrial Metal Detectors[5]
- Other Electrical Equipment[2]
- Flow Meters[4]
- Force Measuring Instruments[1]
- Other Lights & Lighting Products[1]
- Contact Person : Ms. Liu Wendy
- Company Name : Mitech Co., Ltd.
- Tel : 86-010-58858657-219
- Fax : 86-010-58850828
- Address : Beijing,Bejing,E-506, Power Creative Building ,No.1 Shangdi East Road ,Haidian District,Beijng
- Country/Region : China
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Introduction
MUTSX Multi-channel Ultrasonic Flaw detector is a multi-channel, distributed and modular ultrasonic flaw detector. It can quickly and accurately test various defects (cracks, inclusion, stoma and so on) inner the workpiece, orientate, evaluate and diagnose the defects without damaging the workpiece. This device can be widely used in manufacturing industry, iron and steel metallurgy industry, metal-processing industry and other industries which needs to test the defects and control the quality.
Features
Range
l Up to 1200 mm in steel; range selectable in fixed steps or continuously variable. It is suitable for use on large work pieces and in high-resolution measurements.
Pulser
pulse amplitude: 600V
pulse width: within the range of(0.1~0.512)μs, it can be continuously adjusted to match probes with different frequency .
Test modes include Pulse echo, dual and thru-transmission
Receiver
Sampling:8-digit AD Converter at the sampling speed of 100 MHz
Rectification:Positive Halfwave, Negative Halfwave, Fullwave and RF
Frequency band: 0.2~20MHz, automatically match probes according with the probe’s frequency, without manual settings.
Gates
Each channel has three working gates and a tracing gate, all of which can be separately disabled or enabled.
Gate Start: Variable over entire displayed range
Gate Width: Variable from Gate Start to end of displayed range
Gate Height: Variable from 0 to 99% Full Screen Height
Alarms: Threshold positive/negative
Gate start width and height can be adjusted freely. Working gates can be set as positive alarm or negative alarm.
Gain
Gain value of each channel ranges from 0 to 110dB. The stepping value can be set as 0.1dB, 1dB, 2dB or 6dB.
Data Storage
All the detection result data can be monitored and collected timely, and the data collected is transferred to monitor computer through Ethernet. The monitor software will record the detecting process in the form of video. The whole test process can be replayed through software. The software provides tools to generate test reports based upon the collected data.
Specifications
Range: 0 to 1200mm, at steel velocity
Material Velocity: 1000 to 15000m/s
Display Delay: -20 to 3400 μs
Probe Delay/Zero Offset : 0 to 99.99μs
Sensitivity: 110 dB max in selectable resolution 0.1, 1.0, 2.0, 6.0 dB
Test Modes: Pulse echo, dual element and thru-transmission
Pulser: Tunable Square Wave Pulser
Pulse Repetition Frequency: 10 Hz ~ 5000 Hz
Pulse Energy: 600V
Bandwidth (amplifier bandpass ): 0.2 to 20 MHz
Gate Monitors: Four independent gates controllable over entire sweep range
Rectification: Positive half wave, negative half wave, full wave, RF
System Linearity: Horizontal: +/-0.2% FSW, Vertical: 0.25% FSH, Amplifier Accuracy +/-1 dB.
Units: millimeter
Power Requirements: AC Mains 100-240 VAC, 50-60 Hz
Operating Temperature: -10°C to 50°C
Storage Temperature: -30°C to 50°C
MUTSX Software
Introduction
The monitor software is used to cooperate with MUTSX ultrasonic detector. It connects the hardware device through Ethernet connection, collecting data from equipment and sending control commands to the equipment.
Features
Receive data through a network cable directly. It is convenient to operate and easy to use and debug on the site.
A-Scan view can display 1, 2, 4, 8 or 32 channels of waveforms concurrently.
Rolling alarming view, which displays recent alarms, enables the users to notice the alarm properly even the alarming time is short.
B-Scan window represents a macroscopic view of detection result.
It can automatically generate detection report with product information and flaw statistics.
Configuration parameters can be saved and loaded. All parameters used by detection channels can be saved on local directories and can be reloaded when necessary.